( en | de | ru )

 

Disambiguation of "Nahar, Amit"

Author of the publication

copydeleteadd this publication to your clipboard
Burn-in reduction using principal component analysis.

, , and . ITC, page 10. IEEE Computer Society, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Regina Amith-Borchart

Menachem Amitai

Hazem al- Nahar

Samuel Amiteye

Menachem Amitai

 

Other publications of authors with the same name

Harnessing process variations for optimizing wafer-level probe-test flow., , , , , and . ITC, page 1-8. IEEE, (2016)A machine learning approach to fab-of-origin attestation., , , , , and . ICCAD, page 92. ACM, (2016)What we know after twelve years developing and deploying test data analytics solutions., , and . ITC, page 1-8. IEEE, (2016)Yield prognosis for fab-to-fab product migration., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)Harnessing fabrication process signature for predicting yield across designs., , , , , and . ISCAS, page 898-901. IEEE, (2016)Statistical outlier screening as a test solution health monitor., , , and . ITC, page 1-10. IEEE, (2016)Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion., , , , , and . ICCAD, page 9-14. IEEE, (2015)Quality improvement and cost reduction using statistical outlier methods., , , and . ICCD, page 64-69. IEEE Computer Society, (2009)Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing., , , , , and . VTS, page 1-7. IEEE, (2023)Machine Learning-Based Overkill Reduction through Inter-Test Correlation., , , , , and . VTS, page 1-7. IEEE, (2022)