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A radio-frequency CMOS active inductor and its application in designing high-Q filters.

, , , , and . ISCAS (4), page 197-200. IEEE, (2004)

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Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data., , , and . ITC, page 1240. IEEE Computer Society, (2002)Die-level adaptive test: Real-time test reordering and elimination., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)A radio-frequency CMOS active inductor and its application in designing high-Q filters., , , , and . ISCAS (4), page 197-200. IEEE, (2004)Variance reduction using wafer patterns in I_ddQ data., , , and . ITC, page 189-198. IEEE Computer Society, (2000)Variance reduction and outliers: statistical analysis of semiconductor test data., and . ITC, page 9. IEEE Computer Society, (2005)The value of statistical testing for quality, yield and test cost improvement., , , and . ITC, page 10. IEEE Computer Society, (2005)Burn-in reduction using principal component analysis., , and . ITC, page 10. IEEE Computer Society, (2005)Isolating and Removing Sources of Variation in Test Data., , , , and . ITC, page 464-471. IEEE Computer Society, (2002)High Speed Interconnection Using the Clos Network., , and . ICS, volume 297 of Lecture Notes in Computer Science, page 96-111. Springer, (1987)TEM2P2EST: A Thermal Enabled Multi-model Power/Performance ESTimator., , , and . PACS, volume 2008 of Lecture Notes in Computer Science, page 112-125. Springer, (2000)