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Disambiguation of "Adham, Saman"

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A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering.

, , , , , and . VLSI-DAT, page 1-4. IEEE, (2019)

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Barmak Adhami

Mahin Adhami

Ibrahim Adham

Adham Osseiran

Saman Barghi

 

Other publications of authors with the same name

Improved Core Isolation and Access for Hierarchical Embedded Test., , and . IEEE Des. Test Comput., 26 (1): 18-25 (2009)The importance of DFX, a foundry perspective., , , , and . ITC, page 1-6. IEEE Computer Society, (2014)Test Reuse at System Level., , , , and . VTS, page 318-319. IEEE Computer Society, (1998)15.9 A 16nm 16Mb Embedded STT-MRAM with a 20ns Write Time, a 1012 Write Endurance and Integrated Margin-Expansion Schemes., , , , , , , , , and 16 other author(s). ISSCC, page 292-294. IEEE, (2024)A BIST Algorithm for Bit/Group Write Enable Faults in SRAMs., and . MTDT, page 98-101. IEEE Computer Society, (2004)BIST Fault Diagnosis in Scan-Based VLSI Environments., and . ITC, page 48-57. IEEE Computer Society, (1996)Linking Diagnostic Software to Hardware Self Test in Telecom Systems., , and . ITC, page 986-993. IEEE Computer Society, (1995)Comprehensive defect analysis and testability of current-mode logic circuits., , , and . ISCAS, page 339-342. IEEE, (2000)Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoSTM/3D ICs., , , , and . VLSI-DAT, page 1-4. IEEE, (2014)A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering., , , , , and . VLSI-DAT, page 1-4. IEEE, (2019)