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GreyConE: Greybox Fuzzing + Concolic Execution Guided Test Generation for High Level Designs., , , and . ITC, page 494-498. IEEE, (2022)Fortifying RTL Locking Against Oracle-Less (Untrusted Foundry) and Oracle-Guided Attacks., , , , , , and . DAC, page 91-96. IEEE, (2021)Robust Deep Learning for IC Test Problems., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (1): 183-195 (2022)Towards the Imagenets of ML4EDA., , , , and . CoRR, (2023)Special Session: Machine Learning for Semiconductor Test and Reliability., , , , , , , , , and . VTS, page 1-11. IEEE, (2021)ALMOST: Adversarial Learning to Mitigate Oracle-less ML Attacks via Synthesis Tuning., , , , , , , and . DAC, page 1-6. IEEE, (2023)Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test., , , , and . ATS, page 25-30. IEEE, (2019)ATPG Binning and SAT-Based Approach to Hardware Trojan Detection for Safety-Critical Systems., , and . NSS, volume 11058 of Lecture Notes in Computer Science, page 391-410. Springer, (2018)Explaining and Interpreting Machine Learning CAD Decisions: An IC Testing Case Study., , , , and . MLCAD, page 129-134. ACM, (2020)VeriAbs: Verification by Abstraction and Test Generation - (Competition Contribution)., , , , , , , , and . TACAS (2), volume 10806 of Lecture Notes in Computer Science, page 457-462. Springer, (2018)