Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Error Detection and Correction in Microprocessor Core and Memory Due to Fast Dynamic Voltage Droops., , , , , , , , , and 1 other author(s). IEEE J. Emerg. Sel. Topics Circuits Syst., 1 (3): 208-217 (2011)A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance., , , , , , , , , and 1 other author(s). IEEE J. Solid State Circuits, 46 (1): 194-208 (2011)PVT-and-aging adaptive wordline boosting for 8T SRAM power reduction., , , , , , , , and . ISSCC, page 352-353. IEEE, (2010)16.1 A nanogap transducer array on 32nm CMOS for electrochemical DNA sequencing., , , , , , , , , and 1 other author(s). ISSCC, page 288-289. IEEE, (2016)Dynamic variation monitor for measuring the impact of voltage droops on microprocessor clock frequency., , , , , , , , , and . CICC, page 1-4. IEEE, (2010)Resilient microprocessor design for high performance & energy efficiency., , , , , , , , , and 1 other author(s). ISLPED, page 355-356. ACM, (2010)Resilient design in scaled CMOS for energy efficiency., , , , , , , , , and 2 other author(s). ASP-DAC, page 625. IEEE, (2010)A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance., , , , , , , , , and 1 other author(s). ISSCC, page 282-283. IEEE, (2010)Capacitive-coupling wordline boosting with self-induced VCC collapse for write VMIN reduction in 22-nm 8T SRAM., , , , , and . ISSCC, page 234-236. IEEE, (2012)Content Addressable Memory for Low-Power and High-Performance Applications., , and . CSIE (3), page 423-427. IEEE Computer Society, (2009)