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Disambiguation of "Tschanz, James W."

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A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance.

, , , , , , , , , , and . ISSCC, page 282-283. IEEE, (2010)

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Marcel Tschanz

Karl Tschanz

Michael James

Audrein James

Katherine James

 

Other publications of authors with the same name

An energy harvesting wireless sensor node for IoT systems featuring a near-threshold voltage IA-32 microcontroller in 14nm tri-gate CMOS., , , , , , , , , and 2 other author(s). VLSI Circuits, page 1-2. IEEE, (2016)Total power optimization by simultaneous dual-Vt allocation and device sizing in high performance microprocessors., , , , , , , and . DAC, page 486-491. ACM, (2002)14.9 A Monolithic 10.5W/mm2600 MHz Top-Metal and C4 Planar Spiral Inductor-Based Integrated Buck Voltage Regulator on 16nm-Class CMOS., , , , , , , , , and 4 other author(s). ISSCC, page 270-272. IEEE, (2024)Peak-Current-Controlled Ganged Integrated High-Frequency Buck Voltage Regulators in 22nm CMOS for Robust Cross-Tile Current Sharing., , , , , , , , , and 1 other author(s). ISSCC, page 262-264. IEEE, (2021)SUB 45nm Low Power Design Challenges.. ISQED, page 4. IEEE Computer Society, (2007)Circuit techniques for dynamic variation tolerance., , , , , , and . DAC, page 4-7. ACM, (2009)A Skewed Repeater Bus Architecture for On-Chip Energy Reduction in Microprocessors., , , , , , , and . ICCD, page 253-257. IEEE Computer Society, (2005)8.6 Enabling wide autonomous DVFS in a 22nm graphics execution core using a digitally controlled hybrid LDO/switched-capacitor VR with fast droop mitigation., , , , , , , , , and 2 other author(s). ISSCC, page 1-3. IEEE, (2015)Within-die variation-aware dynamic-voltage-frequency scaling core mapping and thread hopping for an 80-core processor., , , , , , , , , and 2 other author(s). ISSCC, page 174-175. IEEE, (2010)Within-Die Variation-Aware Dynamic-Voltage-Frequency-Scaling With Optimal Core Allocation and Thread Hopping for the 80-Core TeraFLOPS Processor., , , , , , , , , and 2 other author(s). IEEE J. Solid State Circuits, 46 (1): 184-193 (2011)