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A harmonic cancellation-based high-frequency on-chip sinusoidal signal generator with calibration using a coarse-fine delay cell.

, , , and . ISCAS, page 1-5. IEEE, (2023)

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Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST., , , and . VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 129-148. Springer, (2014)Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors., , , , , and . ISVLSI, page 627. IEEE Computer Society, (2015)CAT Platform for Analogue and Mixed-Signal Test Evaluation and Optimization., , , and . VLSI-SoC (Selected Papers), volume 249 of IFIP, page 281-300. Springer, (2006)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , and 7 other author(s). MWSCAS, page 1081-1084. IEEE, (2014)An implementation of memory-based on-chip analogue test signal generation., , , and . ASP-DAC, page 663-668. ACM, (2003)Special Session on RF/5G Test., , , , , , , , , and 6 other author(s). ETS, page 1-9. IEEE, (2022)On-chip calibration for high-speed harmonic cancellation-based sinusoidal signal generators., , , and . ATS, page 43-48. IEEE, (2022)Re-engineering hardware specifications by exploiting design semantics., and . EURO-DAC, page 336-341. IEEE Computer Society, (1994)New techniques for selecting test frequencies for linear analog circuits., , , , and . VLSI-SoC, page 90-95. IEEE, (2013)On-chip Pseudorandom Testing for Linear and Nonlinear MEMS., , , and . VLSI-SoC, volume 240 of IFIP, page 245-266. Springer, (2005)