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Disambiguation of "Miyase, Kohei"

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On Improving Defect Coverage of Stuck-at Fault Tests.

, , , , and . Asian Test Symposium, page 216-223. IEEE Computer Society, (2005)

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Kohei Tatsumi

Kohei Tatsumi

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Other publications of authors with the same name

A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits., , , , , , , and . VTS, page 197-202. IEEE Computer Society, (2012)Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory., , and . IOLTS, page 226-227. IEEE, (2018)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression., , , , , and . VLSI Design, page 279-284. IEEE Computer Society, (2013)On Improving Defect Coverage of Stuck-at Fault Tests., , , , and . Asian Test Symposium, page 216-223. IEEE Computer Society, (2005)A Method of Static Test Compaction Based on Don't Care Identification., , and . DELTA, page 392-395. IEEE Computer Society, (2002)A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications., , , and . ITC, page 63-72. IEEE, (2022)Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing., , , and . ITC, page 1-10. IEEE Computer Society, (2008)Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling., , , , , , , , , and 1 other author(s). Asian Test Symposium, page 90-95. IEEE Computer Society, (2011)CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing., , , , , , , and . Asian Test Symposium, page 99-104. IEEE Computer Society, (2009)High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme., , , , , , , and . IEICE Trans. Inf. Syst., 93-D (1): 2-9 (2010)