Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.

K. Miyase, X. Wen, H. Furukawa, Y. Yamato, S. Kajihara, P. Girard, L. Wang, and M. Tehranipoor. IEICE Trans. Inf. Syst., 93-D (1): 2-9 (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Fault Diagnosis of Physical Defects Using Unknown Behavior Model.X. Wen, H. Tamamoto, K. Saluja, and K. Kinoshita. J. Comput. Sci. Technol., 20 (2): 187-194 (2005)Towards the next generation of low-power test technologies.X. Wen. ASICON, page 232-235. IEEE, (2011)Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test.S. Holst, S. Shi, and X. Wen. PRDC, page 124-129. IEEE, (2019)A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells.Z. Song, A. Yan, J. Cui, Z. Chen, X. Li, X. Wen, C. Lai, Z. Huang, and H. Liang. ITC-Asia, page 139-144. IEEE, (2019)Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications.A. Yan, Z. Wu, L. Lu, Z. Chen, J. Song, Z. Ying, P. Girard, and X. Wen. ATS, page 43-48. IEEE, (2019)Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications.A. Yan, Z. Fan, L. Ding, J. Cui, Z. Huang, Q. Wang, H. Zheng, P. Girard, and X. Wen. IEEE Trans. Aerosp. Electron. Syst., 58 (1): 517-529 (2022)Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications.A. Yan, J. Xiang, Y. Chang, Z. Huang, J. Cui, P. Girard, and X. Wen. Microelectron. J., (September 2023)Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling.S. Shi, S. Holst, and X. Wen. MCSoC, page 501-507. IEEE, (2023)Test Pattern Modification for Average IR-Drop Reduction.W. Ding, H. Hsieh, C. Han, J. Li, and X. Wen. IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 38-49 (2016)Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding.D. Xiang, X. Wen, and L. Wang. IEEE Trans. Very Large Scale Integr. Syst., 25 (3): 942-953 (2017)

BibSonomy

Disambiguation of "Wen, Xiaoqing"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Xiaoqing"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.