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Другие публикации лиц с тем же именем

A Physics-based Model for Long Term Data Retention Characteristics in 3D NAND Flash Memory., , и . IRPS, стр. 1-6. IEEE, (2023)Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs., , , , , , и . IRPS, стр. 1-8. IEEE, (2021)Hot Carrier Degradation in Cryo-CMOS., , , и . IRPS, стр. 1-5. IEEE, (2020)Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions., , , , , , , , , и 4 other автор(ы). IRPS, стр. 1-5. IEEE, (2024)Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories., , , , , , , и . IMW, стр. 1-4. IEEE, (2024)A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake., , , и . IRPS, стр. 1-6. IEEE, (2021)Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs., , , , и . IRPS, стр. 1-5. IEEE, (2021)BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity., , , , , , , , и . IRPS, стр. 1-7. IEEE, (2020)On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs., , , , , и . IRPS, стр. 1-8. IEEE, (2019)A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions., , и . IRPS, стр. 1-6. IEEE, (2024)