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Disambiguation of "Labat, Nathalie"

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Kink effect characterization in AlGaN/GaN HEMTs by DC and drain current transient measurements.

, , , , and . ESSDERC, page 270-273. IEEE, (2012)

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Vincent Labatut

Ernst Labatzki

Nathalie Domanoldou

Nathalie Véron

Nathalie Schmitz

 

Other publications of authors with the same name

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis., , , and . Microelectron. Reliab., (2017)On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise., , , , and . Microelectron. Reliab., 44 (9-11): 1387-1392 (2004)Reliability assessment of ultra-short gate length AlGaN/GaN HEMTs on Si substrate by on-state step stress., , , , , , and . Microelectron. Reliab., (2016)Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations., , , , , , , and . Microelectron. Reliab., 50 (9-11): 1520-1522 (2010)Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors., , , and . Microelectron. Reliab., 44 (9-11): 1361-1368 (2004)Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses., , , , , , , and . Microelectron. Reliab., 41 (9-10): 1573-1578 (2001)Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes., , , , , , and . Microelectron. Reliab., 55 (9-10): 1741-1745 (2015)Kink effect characterization in AlGaN/GaN HEMTs by DC and drain current transient measurements., , , , and . ESSDERC, page 270-273. IEEE, (2012)Thermal and statistical analysis of various AlN/GaN HEMT geometries for millimeter Wave applications., , , , , and . IRPS, page 1-5. IEEE, (2023)Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors., , , , and . IRPS, page 4. IEEE, (2018)