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Layout-Based Dual-Cell-Aware Tests.

T. Wu, D. Lee, Y. Huang, M. Chao, K. Wu, S. Kao, Y. Chen, P. Chen, M. Chern, and J. Lee. VTS, page 1-6. IEEE, (2019)

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Hsi-Lin Chao

Zouheir Chaoui

Kuo-Yih Chao

Hanna Huey-Jiun Chao

Rabih Chaoui

Other publications of authors with the same name

Generating Routing-Driven Power Distribution Networks With Machine-Learning Technique.W. Chang, C. Lin, S. Mu, L. Chen, C. Tsai, Y. Chiu, and M. Chao. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (8): 1237-1250 (2017)Test Generation for Defect-Based Faults of Scan Flip-Flops.Y. Nien, C. Li, P. Wu, Y. Wang, K. Wu, and M. Chao. VTS, page 1-7. IEEE, (2023)Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.T. Huang, W. Hung, H. Yang, W. Chang, Y. Chen, C. Kuo, J. Lee, and M. Chao. ASP-DAC, page 426-431. IEEE, (2017)Methodology of generating dual-cell-aware tests.Y. Huang, C. Lu, T. Wu, Y. Nien, Y. Chen, M. Wu, J. Lee, and M. Chao. VTS, page 1-6. IEEE Computer Society, (2017)Rule Generation for Classifying SLT Failed Parts.H. Hsu, C. Lu, S. Wang, K. Jones, K. Wu, and M. Chao. VTS, page 1-7. IEEE, (2022)Path-Based Pre-Routing Timing Prediction for Modern Very Large-Scale Integration Designs.L. Chen, Y. Sui, T. Lee, Y. Li, M. Chao, I. Tsai, T. Kung, E. Liu, and Y. Chang. ISQED, page 1-6. IEEE, (2022)Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax.S. Mu, W. Chang, M. Chao, Y. Wang, M. Chang, and M. Tsai. ICCAD, page 116. ACM, (2016)Test Methodology for Defect-based Bridge Faults.Y. Hu, S. Chang, K. Wu, C. Wang, F. Huang, Y. Tang, Y. Chen, M. Chen, and M. Chao. ITC-Asia, page 106-111. IEEE, (2020)Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.C. Tsai, K. Lee, C. Lin, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. VTS, page 1-6. IEEE Computer Society, (2016)A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.C. Lin, C. Tsai, K. Lee, S. Yu, W. Liau, A. Hou, Y. Chen, C. Kuo, J. Lee, and M. Chao. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (10): 2139-2151 (2018)

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Disambiguation of "Chao, Mango C.-T."

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Layout-Based Dual-Cell-Aware Tests.

Please choose a person to relate this publication to

Hsi-Lin Chao

Zouheir Chaoui

Kuo-Yih Chao

Hanna Huey-Jiun Chao

Rabih Chaoui

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chao, Mango C.-T."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Layout-Based Dual-Cell-Aware Tests.

Please choose a person to relate this publication to

Hsi-Lin Chao

Zouheir Chaoui

Kuo-Yih Chao

Hanna Huey-Jiun Chao

Rabih Chaoui

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Layout-Based Dual-Cell-Aware Tests.