( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case study.

, , , , , , , , , , , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Herbert Brion

Hans Georg Brion

Jean-Frédéric Reyss-Brion

L Solymosi

L Bräuer

 

Другие публикации лиц с тем же именем

OPMISR: the foundation for compressed ATPG vectors., , , , , , и . ITC, стр. 748-757. IEEE Computer Society, (2001)A SmartBIST Variant with Guaranteed Encoding., , , , , и . Asian Test Symposium, стр. 325-. IEEE Computer Society, (2001)Optimizing Test Data Volume Using Hybrid Compression., , , , и . ATS, стр. 157-162. IEEE Computer Society, (2008)Channel Masking Synthesis for Efficient On-Chip Test Compression., , и . ITC, стр. 452-461. IEEE Computer Society, (2004)An Economic Analysis and ROI Model for Nanometer Test., , , и . ITC, стр. 518-524. IEEE Computer Society, (2004)Encounter test OPMISR+ on-chip compression.. ITC, стр. 2. IEEE Computer Society, (2005)Use of MISRs for compression and diagnostics., и . ITC, стр. 9. IEEE Computer Society, (2005)Design Automation of Test for the EX/9000TM Series Processors., и . ICCD, стр. 550-553. IEEE Computer Society, (1991)Using Programmable On-Product Clock Generation (OPCG) for Delay Test., , , и . ATS, стр. 69-72. IEEE, (2007)High Performance Parallel Fault Simulation., , , и . ICCD, стр. 308-313. IEEE Computer Society, (2001)