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Disambiguation of "Mir, Salvador"

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Test Education in the Global Economy.

, , , , and . ATS, page 53. IEEE, (2007)

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Mir Ferdowsi

Michael Salvador

Salvador Herrador

Salvador Oberhaus

Salvador Fernandes

 

Other publications of authors with the same name

Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times., , , , , and . ITC, page 1-7. IEEE, (2015)New techniques for selecting test frequencies for linear analog circuits., , , , and . VLSI-SoC, page 90-95. IEEE, (2013)On-chip Pseudorandom Testing for Linear and Nonlinear MEMS., , , and . VLSI-SoC, volume 240 of IFIP, page 245-266. Springer, (2005)Re-engineering hardware specifications by exploiting design semantics., and . EURO-DAC, page 336-341. IEEE Computer Society, (1994)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , and 7 other author(s). MWSCAS, page 1081-1084. IEEE, (2014)CAT Platform for Analogue and Mixed-Signal Test Evaluation and Optimization., , , and . VLSI-SoC (Selected Papers), volume 249 of IFIP, page 281-300. Springer, (2006)On the Integration of Design and Test for Chips Embedding MEMS., and . IEEE Des. Test Comput., 16 (4): 28-38 (1999)On-chip calibration for high-speed harmonic cancellation-based sinusoidal signal generators., , , and . ATS, page 43-48. IEEE, (2022)An implementation of memory-based on-chip analogue test signal generation., , , and . ASP-DAC, page 663-668. ACM, (2003)Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST., , , and . VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 129-148. Springer, (2014)