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Progress on carbon nanotube BEOL interconnects., , , , , , , , , и 11 other автор(ы). DATE, стр. 937-942. IEEE, (2018)Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow., , , , , , , , , и 5 other автор(ы). ESSDERC, стр. 238-241. IEEE, (2015)Modeling of statistical variability in nanoscale charge-trap flash memories.. Polytechnic University of Milan, Italy, (2012)Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits., , , , , , и . ISCAS, стр. 2449-2452. IEEE, (2015)FDSOI molecular flash cell with reduced variability for low power flash applications., , , , , и . ESSDERC, стр. 353-356. IEEE, (2014)Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation., , , , и . ESSDERC, стр. 109-112. IEEE, (2012)Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development., , , , , , и . IMW, стр. 1-4. IEEE, (2024)Experimental evidences and simulations of trap generation along a percolation path., , , , , , , , , и . ESSDERC, стр. 226-229. IEEE, (2015)