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Disambiguation of "Weckx, Pieter"

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Experimental evidences and simulations of trap generation along a percolation path.

, , , , , , , , , and . ESSDERC, page 226-229. IEEE, (2015)

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Pieter Ploumen

Pieter Wolter

Pieter Zwieten

Pieter Dingeldey

Pieter Steenhuis

 

Other publications of authors with the same name

The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies., , , , , , , , , and 10 other author(s). IRPS, page 1-6. IEEE, (2021)Backside PDN and 2.5D MIMCAP to Double Boost 2D and 3D ICs IR-Drop beyond 2nm Node., , , , , , , , , and 7 other author(s). VLSI Technology and Circuits, page 429-430. IEEE, (2022)Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs)., , , , , , , , , and 6 other author(s). IRPS, page 1-7. IEEE, (2023)On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs., , , and . LATW, page 1-4. IEEE, (2014)Experimental evidences and simulations of trap generation along a percolation path., , , , , , , , , and . ESSDERC, page 226-229. IEEE, (2015)Block-level Evaluation and Optimization of Backside PDN for High-Performance Computing at the A14 node., , , , , , , , , and 4 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level., , , , , , , , , and 5 other author(s). DATE, page 1-10. IEEE, (2023)Design of a 150 mV Supply, 2 MIPS, 90nm CMOS, Ultra-Low-Power Microprocessor., , , and . PATMOS, volume 7606 of Lecture Notes in Computer Science, page 175-184. Springer, (2012)Methodology for Application-Dependent Degradation Analysis of Memory Timing., , , , , , and . DATE, page 162-167. IEEE, (2019)