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Disambiguation of "Simicic, Marko"

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Experimental evidences and simulations of trap generation along a percolation path.

, , , , , , , , , and . ESSDERC, page 226-229. IEEE, (2015)

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Ana Markovi

Experimental and theoretical analysis of the mass transport through porous glass membranes with different pore diameters. Uni Magdeburg, (2009)

Marko Legler

Untersuchungen zur Konzentration von zyklischem Guanosinmonophosphat (cGMP) im Blutplasma bei Tauben (Columba livia f. dom.) mit experimentell gesteigerter Nachlast und linksventrikulärer Dilatation des Herzens. TierH Hannover, (2009)

Ilse Markolf

Gustav Markowitz

Walter Markov

 

Other publications of authors with the same name

Degradation mechanisms in Germanium Electro-Absorption Modulators., , , , , , , , and . IRPS, page 9. IEEE, (2022)Characterization and simulation methodology for time-dependent variability in advanced technologies., , , , , , , , , and 1 other author(s). CICC, page 1-8. IEEE, (2015)Scaling CMOS beyond Si FinFET: an analog/RF perspective., , , , , , , , , and 4 other author(s). ESSDERC, page 158-161. IEEE, (2018)ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology., , , , and . ESSDERC, page 194-197. IEEE, (2018)Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow., , , , , , , , , and 5 other author(s). ESSDERC, page 238-241. IEEE, (2015)Self-heating-aware CMOS reliability characterization using degradation maps., , , , , , , and . IRPS, page 2. IEEE, (2018)Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (3): 601-610 (2019)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)Experimental evidences and simulations of trap generation along a percolation path., , , , , , , , , and . ESSDERC, page 226-229. IEEE, (2015)CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies., , , , , , , , , and . IRPS, page 1-7. IEEE, (2019)