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Path Delay Measurement with Correction for Temperature And Voltage Variations., , and . ITC-Asia, page 112-117. IEEE, (2020)On-Chip Delay Measurement for In-Field Test of FPGAs., , and . PRDC, page 130-137. IEEE, (2019)An On-Chip Digital Environment Monitor for Field Test., , , and . ATS, page 254-257. IEEE Computer Society, (2014)On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor., , , and . ATS, page 1-6. IEEE, (2020)Innovative Test Practices in Asia., , , , , , , , , and 3 other author(s). VTS, page 1. IEEE, (2020)On-Chip Test Clock Validation Using A Time-to-Digital Converter in FPGAs., , and . ITC-Asia, page 157-162. IEEE, (2019)A 1-ps Bin Size 4.87-ps Resolution FPGA Time-to-Digital Converter Based on Phase Wrapping Sorting and Selection., , , , , , and . IEEE Access, (2022)On the effects of real time and contiguous measurement with a digital temperature and voltage sensor., , and . ITC-Asia, page 125-130. IEEE, (2017)Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test., , , and . ATS, page 156-161. IEEE Computer Society, (2014)On-chip temperature and voltage measurement for field testing., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)