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Innovative Test Practices in Asia.

, , , , , , , , , , , , и . VTS, стр. 1. IEEE, (2020)

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Yoko Miyake

 

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Path Delay Measurement with Correction for Temperature And Voltage Variations., , и . ITC-Asia, стр. 112-117. IEEE, (2020)On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor., , , и . ATS, стр. 1-6. IEEE, (2020)An On-Chip Digital Environment Monitor for Field Test., , , и . ATS, стр. 254-257. IEEE Computer Society, (2014)On-Chip Delay Measurement for In-Field Test of FPGAs., , и . PRDC, стр. 130-137. IEEE, (2019)Innovative Test Practices in Asia., , , , , , , , , и 3 other автор(ы). VTS, стр. 1. IEEE, (2020)High-Precision PLL Delay Matrix With Overclocking and Double Data Rate for Accurate FPGA Time-to-Digital Converters., , , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 28 (4): 904-913 (2020)On-Chip Test Clock Validation Using A Time-to-Digital Converter in FPGAs., , и . ITC-Asia, стр. 157-162. IEEE, (2019)On Correction of A Delay Value Using Ring-Oscillators for Aging Detection and Prediction., , и . ATS, стр. 60-65. IEEE, (2022)A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor., , и . ITC-Asia, стр. 13-18. IEEE, (2019)On-chip temperature and voltage measurement for field testing., , , и . European Test Symposium, стр. 1. IEEE Computer Society, (2012)