( en | de | ru )

 

Disambiguation of "Matsushima, Jun"

Author of the publication

copydeleteadd this publication to your clipboard
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test.

, , and . ATS, page 237-241. IEEE Computer Society, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Jun Jun Lu

Jun Yang

Jun Li

Jun Yang

Manfred Jun

 

Other publications of authors with the same name

A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy., , , , , , and . ITC, page 1-10. IEEE, (2023)A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule., , , and . ISQED, page 184-190. IEEE, (2010)A 16 nm FinFET Heterogeneous Nona-Core SoC Supporting ISO26262 ASIL B Standard., , , , , , , and . IEEE J. Solid State Circuits, 52 (1): 77-88 (2017)Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST., , , , , , and . ATS, page 155-160. IEEE, (2018)Innovative practices on test in Japan., , , , , and . VTS, page 1. IEEE Computer Society, (2018)A Power Reduction Method for Scan Testing in Ultra-Low Power Designs., , and . ATS, page 141. IEEE, (2021)An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms., , , and . Asian Test Symposium, page 1. IEEE Computer Society, (2012)Multi-configuration Scan Structure for Various Purposes., and . ATS, page 131. IEEE Computer Society, (2016)CooLBIST: An Effective Approach of Test Power Reduction for LBIST., , and . ATS, page 264. IEEE Computer Society, (2008)Automotive Functional Safety Assurance by POST with Sequential Observation., , , , and . IEEE Des. Test, 35 (3): 39-45 (2018)