Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.

S. Wang, T. Aono, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. ATS, page 155-160. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yoichi Kiuchi

Yoichi Otani

Yoichi Ishikawa

Ryozo Maeda

Daniel Maeda

Other publications of authors with the same name

Viewing Cube and Its Visual Angles.Y. Maeda. JCDCG, volume 2866 of Lecture Notes in Computer Science, page 192-199. Springer, (2002)Active Learning with Dynamic Geometry Software.Y. Maeda. ICCSA (4), volume 10407 of Lecture Notes in Computer Science, page 228-239. Springer, (2017)Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262.S. Wang, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. ETS, page 1-2. IEEE, (2018)FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST.H. Al-Awadhi, T. Aono, S. Wang, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. IEICE Trans. Inf. Syst., 103-D (11): 2289-2301 (2020)Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test.Y. Maeda, J. Matsushima, and R. Press. ATS, page 237-241. IEEE Computer Society, (2017)Selected papers from the Fifth ITU Kaleidoscope Academic Conference Series Editorial.M. Sherif, Y. Maeda, K. Jakobs, and M. Adolph. IEEE Communications Magazine, 52 (1): 174-175 (2014)Seven Types of Random Spherical Triangle in S n and Their Probabilities.Y. Maeda. KyotoCGGT, volume 4535 of Lecture Notes in Computer Science, page 119-126. Springer, (2007)A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy.H. Iwata, Y. Maeda, J. Matsushima, O. Laouamri, N. Khanna, J. Mayer, and N. Mukherjee. ITC, page 1-10. IEEE, (2023)Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.S. Wang, T. Aono, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. ATS, page 155-160. IEEE, (2018)Innovative practices on test in Japan.K. Asami, Y. Tamura, H. Kobayashi, J. Matsushima, Y. Maeda, and K. Hatayama. VTS, page 1. IEEE Computer Society, (2018)

BibSonomy

Disambiguation of "Maeda, Yoichi"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.

Please choose a person to relate this publication to

Yoichi Kiuchi

Yoichi Otani

Yoichi Ishikawa

Ryozo Maeda

Daniel Maeda

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Maeda, Yoichi"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.

Please choose a person to relate this publication to

Yoichi Kiuchi

Yoichi Otani

Yoichi Ishikawa

Ryozo Maeda

Daniel Maeda

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.