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Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.

S. Wang, T. Aono, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. ATS, page 155-160. IEEE, (2018)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylationL. Wang. Uni Marburg, (2009)

Paul Wang

Lien Wang

Scheifoo Wang

Other publications of authors with the same name

Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation.T. Inamoto, T. Nishino, S. Wang, Y. Higami, and H. Takahashi. GCCE, page 561-565. IEEE, (2022)On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST.S. Oshima, T. Kato, S. Wang, Y. Sato, and S. Kajihara. ATS, page 30-35. IEEE, (2018)Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning.M. Nie, W. Jiang, W. Yang, S. Wang, X. Wen, and T. Ni. ATS, page 1-6. IEEE, (2023)QR-Code with Superimposed Text.N. Tahara, S. Wang, H. Kai, H. Takahashi, and M. Morii. APNOMS, page 259-262. IEEE, (2023)Low Power BIST for Scan-Shift and Capture Power.Y. Sato, S. Wang, T. Kato, K. Miyase, and S. Kajihara. Asian Test Symposium, page 173-178. IEEE Computer Society, (2012)Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262.S. Wang, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. ETS, page 1-2. IEEE, (2018)FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST.H. Al-Awadhi, T. Aono, S. Wang, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. IEICE Trans. Inf. Syst., 103-D (11): 2289-2301 (2020)A Lightweight and Machine-Learning-Resistant PUF framework based on Nonlinear Structure and Obfuscating Challenges.T. Ni, F. Li, Q. Peng, S. Wang, and X. Wen. AsianHOST, page 1-6. IEEE, (2023)Automotive Functional Safety Assurance by POST with Sequential Observation.S. Wang, Y. Higami, H. Takahashi, H. Iwata, and J. Matsushima. IEEE Des. Test, 35 (3): 39-45 (2018)Scan-Out Power Reduction for Logic BIST.S. Wang, Y. Sato, S. Kajihara, and K. Miyase. IEICE Trans. Inf. Syst., 96-D (9): 2012-2020 (2013)

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Disambiguation of "Wang, Senling"

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Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.

Please choose a person to relate this publication to

Wang Wang

Linfang Wang

Paul Wang

Lien Wang

Scheifoo Wang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wang, Senling"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.

Please choose a person to relate this publication to

Wang Wang

Linfang Wang

Paul Wang

Lien Wang

Scheifoo Wang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.