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Machine Learning for Product Engineering in NAND Flash Memory.

, , , , , и . ICEIC, стр. 1-2. IEEE, (2022)

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Jai Prakash

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Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory., , , , , , , , , и 3 other автор(ы). IRPS, стр. 40-1. IEEE, (2022)Machine Learning for Product Engineering in NAND Flash Memory., , , , , и . ICEIC, стр. 1-2. IEEE, (2022)A 512Gb 3b/Cell 7th -Generation 3D-NAND Flash Memory with 184MB/s Write Throughput and 2.0Gb/s Interface., , , , , , , , , и 34 other автор(ы). ISSCC, стр. 426-428. IEEE, (2021)Cell Operation Technologies to Overcome Scale-down Issues in 3D NAND Flash Memory., , , , и . ICEIC, стр. 298-299. IEEE, (2022)Development of 7th generation 3D VNAND Flash Product with COP structure for Growing Demand in Storage Market., , , , , , и . ICEIC, стр. 1-4. IEEE, (2022)Issues and Key Technologies for Next Generation 3D NAND., , , , и . ICEIC, стр. 1-4. IEEE, (2021)A Hybrid ZQ Calibration Design for High-Density Flash Memory Toggle 5.0 High-speed Interface., , , , , , , , , и 3 other автор(ы). A-SSCC, стр. 1-2. IEEE, (2021)Electric Field Impact on Lateral Charge Diffusivity in Charge Trapping 3D NAND Flash Memory., , , , , , и . IRPS, стр. 29-1. IEEE, (2022)A 1.8 Gb/s/pin 16Tb NAND Flash Memory Multi-Chip Package with F-Chip of Toggle 4.0 Specification for High Performance and High Capacity Storage Systems., , , , , , , , , и 16 other автор(ы). VLSI Circuits, стр. 1-2. IEEE, (2020)A 1Tb 3b/Cell 8th-Generation 3D-NAND Flash Memory with 164MB/s Write Throughput and a 2.4Gb/s Interface., , , , , , , , , и 24 other автор(ы). ISSCC, стр. 136-137. IEEE, (2022)