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In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.

G. Filipponi, G. Iaria, M. Reorda, D. Appello, G. Garozzo, and V. Tancorre. ITC, page 646-649. IEEE, (2022)

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Davide Cadamuro

Davide Pennino

Davide Batic

Davide Pagani

Davide Cantoni

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Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores.D. Appello, P. Bernardi, A. Fudoli, M. Rebaudengo, M. Reorda, V. Tancorre, and M. Violante. ITC, page 379-385. IEEE Computer Society, (2003)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test.F. Almeida, P. Bernardi, D. Calabrese, M. Restifo, M. Reorda, D. Appello, G. Pollaccia, V. Tancorre, R. Ugioli, and G. Zoppi. DDECS, page 1-6. IEEE, (2019)Optimized embedded memory diagnosis.M. de Carvalho, P. Bernardi, M. Reorda, N. Campanelli, T. Kerekes, D. Appello, M. Barone, V. Tancorre, and M. Terzi. DDECS, page 347-352. IEEE Computer Society, (2011)A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis.D. Appello, F. Corno, M. Giovinetto, M. Rebaudengo, and M. Reorda. Asian Test Symposium, page 97-102. IEEE Computer Society, (2001)Adapting to adaptive testing.E. Marinissen, A. Singh, D. Glotter, M. Esposito, J. Jr., A. Nahar, K. Butler, D. Appello, and C. Portelli. DATE, page 556-561. IEEE Computer Society, (2010)A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.G. Iaria, F. Angione, P. Bernardi, M. Reorda, D. Appello, G. Garozzo, and V. Tancorre. LATS, page 1-6. IEEE, (2022)In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.G. Filipponi, G. Iaria, M. Reorda, D. Appello, G. Garozzo, and V. Tancorre. ITC, page 646-649. IEEE, (2022)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC.D. Appello, P. Bernardi, C. Bugeja, R. Cantoro, G. Pollaccia, M. Restifo, and F. Venini. J. Electron. Test., 34 (1): 43-52 (2018)A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips.F. Angione, D. Appello, P. Bernardi, A. Calabrese, S. Quer, M. Reorda, V. Tancorre, and R. Ugioli. IEEE Access, (2023)High Accuracy Stimulus Generation for A/D Converter BIST.A. Roy, S. Sunter, A. Fudoli, and D. Appello. ITC, page 1031-1039. IEEE Computer Society, (2002)

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Disambiguation of "Appello, Davide"

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In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.

Please choose a person to relate this publication to

Davide Cadamuro

Davide Pennino

Davide Batic

Davide Pagani

Davide Cantoni

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Appello, Davide"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.

Please choose a person to relate this publication to

Davide Cadamuro

Davide Pennino

Davide Batic

Davide Pagani

Davide Cantoni

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.