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Disambiguation of "Tancorre, Vincenzo"

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In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip.

, , , , , and . ITC, page 646-649. IEEE, (2022)

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Vincenzo Mancuso

Vincenzo Casulli

Vincenzo Mercurio

Vincenzo Ferrazzano

Vincenzo Gulisano

 

Other publications of authors with the same name

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)On the Automation of the Test Flow of Complex SoCs., , , , , and . VTS, page 166-171. IEEE Computer Society, (2006)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , and . VTS, page 1-7. IEEE, (2023)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)On the integration and hardening of Software Test Libraries in Real-Time Operating Systems., , , , , , , and . LATS, page 1-6. IEEE, (2023)An innovative Strategy to Quickly Grade Functional Test Programs., , , , , , , , , and . ITC, page 355-364. IEEE, (2022)Innovative methods for Burn-In related Stress Metrics Computation., , , , , , , , and . DTIS, page 1-6. IEEE, (2021)A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , and . MTDT, page 12-16. IEEE Computer Society, (2002)