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NCFET to Rescue Technology Scaling: Opportunities and Challenges.

, , , , и . ASP-DAC, стр. 637-644. IEEE, (2020)

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Leo van Santen

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Reliability Challenges with Self-Heating and Aging in FinFET Technology., , , , , , и . IOLTS, стр. 68-71. IEEE, (2019)Special Session: Machine Learning for Semiconductor Test and Reliability., , , , , , , , , и . VTS, стр. 1-11. IEEE, (2021)NCFET to Rescue Technology Scaling: Opportunities and Challenges., , , , и . ASP-DAC, стр. 637-644. IEEE, (2020)Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits., , , и . DFT, стр. 1-6. IEEE, (2023)Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks., , , , и . VTS, стр. 1-7. IEEE, (2021)Design Automation for Cryogenic CMOS Circuits., , , , , , , и . DAC, стр. 1-6. IEEE, (2023)BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity., , , , , , , , и . IRPS, стр. 1-7. IEEE, (2020)Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths., , , , , и . IRPS, стр. 1-6. IEEE, (2023)Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology., , , , , и . ASP-DAC, стр. 68-73. IEEE, (2020)Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability., , , , и . IEEE Trans. Circuits Syst. I Regul. Pap., 71 (7): 3269-3281 (июля 2024)