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Should Illinois-Scan Based Architectures be Centralized or Distributed?, , and . DFT, page 406-414. IEEE Computer Society, (2005)Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions., , , , and . Asian Test Symposium, page 202-207. IEEE Computer Society, (2005)Clock Gate Test Points., and . ITC, page 84-93. IEEE Computer Society, (2010)Multiple fault activation cycle tests for transistor stuck-open faults., , , and . ITC, page 821. IEEE Computer Society, (2010)Failure Analysis for Full-Scan Circuits., and . ITC, page 636-645. IEEE Computer Society, (1995)Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests., , , , and . ATS, page 101-106. IEEE Computer Society, (2014)A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals., , , , and . ICCD, page 471-474. IEEE Computer Society, (2005)Test Generation for Open Defects in CMOS Circuits., , , , and . DFT, page 41-49. IEEE Computer Society, (2006)A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults., , , , and . ETS, page 185-192. IEEE Computer Society, (2006)Systematic Scan Reconfiguration., , and . ASP-DAC, page 738-743. IEEE Computer Society, (2007)