Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

On Synthesizing and Identifying Stuck-Open Testable CMOS Combinational Circuits (extended abstract).. DAC, page 736-739. IEEE Computer Society Press, (1990)Special session 11C: Hot topic design consideration and silicon evaluation of on-chip monitors.. VTS, page 350. IEEE Computer Society, (2010)Testing of Prebond Through Silicon Vias., , and . IEEE Des. Test, 37 (4): 27-34 (2020)Computing stress tests for interconnect defects., and . Asian Test Symposium, page 143-148. IEEE Computer Society, (1997)Detection of Internal Stuck-open Faults in Scan Chains., , , , and . ITC, page 1-10. IEEE Computer Society, (2008)Detectability of internal bridging faults in scan chains., , , , and . ASP-DAC, page 678-683. IEEE, (2009)On Computing Tests for Bridging and Leakage Faults: Complexity Results and Universal Test Sets.. VLSI Design, page 49-54. IEEE Computer Society, (1992)IDDQ Measurement Based Diagnosis of Bridging Faults in Full Scan Circuits., and . VLSI Design, page 179-182. IEEE Computer Society, (1994)Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests., , , , and . ATS, page 101-106. IEEE Computer Society, (2014)A Process Monitor Based Speed Binning and Die Matching Algorithm.. Asian Test Symposium, page 311-316. IEEE Computer Society, (2011)