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Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric., , , , и . ACM Great Lakes Symposium on VLSI, стр. 127-130. ACM, (2010)Research on Production-Oriented Virtual Enterprise Quality Information Management., , и . ICSS, стр. 370-373. IEEE Computer Society, (2010)A Personalized Learning Strategy Recommendation Approach for Programming Learning., , , , и . DASFAA Workshops, том 10179 из Lecture Notes in Computer Science, стр. 267-274. Springer, (2017)Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG., , , и . IDT, стр. 122-127. IEEE, (2010)Information Delay Protocol Using Quantum Teleportation., и . ICNC (6), стр. 523-527. IEEE Computer Society, (2009)Robust Corner Finding Based on Multi-Scale K-Cosine Angle Detection., , , , , и . IEEE Access, (2020)Robust identification of Wiener time-delay system with expectation-maximization algorithm., , , и . J. Frankl. Inst., 354 (13): 5678-5693 (2017)Power-safe application of tdf patterns to flip-chip designs during wafer test., , , и . ACM Trans. Design Autom. Electr. Syst., 18 (3): 43:1-43:20 (2013)A novel method for fast identification of peak current during test., , , , , и . VTS, стр. 191-196. IEEE Computer Society, (2012)FDA-PointNet++: A Point Cloud Classification Model Based on Fused Downsampling Strategy and Attention Module., , , , , и . ICAI (1), том 2014 из Communications in Computer and Information Science, стр. 244-255. Springer, (2023)