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Performance Measurement in Blind Audio Source Separation, , and . IEEE Transactions on Speech and Audio Processing, (2006)Spin-glass dynamics : Relation between theory and experiment: a beginning, , , , and . Physica A: Statistical and Theoretical Physics, 185 (1-4): 278--294 (Jun 15, 1992)Performance & reliability of 3D architectures (πfet, Finfet, Ωfet)., , , , , , , , , and . IRPS, page 6. IEEE, (2018)Designing in reliability in advanced CMOS technologies., , , , , , , , and . Microelectron. Reliab., 46 (9-11): 1464-1471 (2006)Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs., , , and . Microelectron. Reliab., 41 (9-10): 1313-1318 (2001)Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs., , , , , , , and . Microelectron. Reliab., 45 (9-11): 1370-1375 (2005)BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations., , , , , , , and . IRPS, page 1-5. IEEE, (2021)Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement., , , and . Microelectron. Reliab., 42 (9-11): 1497-1500 (2002)Failures in ultrathin oxides: Stored energy or carrier energy driven?, , , , and . Microelectron. Reliab., 41 (9-10): 1367-1372 (2001)Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors., , , , , and . Microelectron. Reliab., (2018)