Author of the publication

Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale.

, , , and . IEEE Des. Test Comput., 22 (4): 295-297 (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM., , , and . ASP-DAC, page 203-208. IEEE, (2018)Variation-aware logic mapping for crossbar nano-architectures., and . ASP-DAC, page 317-322. IEEE, (2011)Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects., , , , , , , and . IRPS, page 1-6. IEEE, (2019)MTTF-balanced pipeline design., and . DATE, page 270-275. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Temperature-aware Dynamic Voltage Scaling for Near-Threshold Computing., , and . ACM Great Lakes Symposium on VLSI, page 361-364. ACM, (2016)Design and characterization of an and-or-inverter (AOI) gate for QCA implementation., , , and . ACM Great Lakes Symposium on VLSI, page 426-429. ACM, (2004)Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM., , , , , , and . ITC, page 1-10. IEEE, (2018)Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications., , , , , , and . ITC, page 1-10. IEEE, (2018)Application-Dependent Diagnosis of FPGAs.. ITC, page 645-654. IEEE Computer Society, (2004)Routability and Fault Tolerance of FPGA Interconnect Architectures., , and . ITC, page 479-488. IEEE Computer Society, (2004)