Author of the publication

Block and Subword-Scaling Floating-Point (BSFP) : An Efficient Non-Uniform Quantization For Low Precision Inference.

, , and . ICLR, OpenReview.net, (2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A Neuromorphic Computing System for Bitwise Neural Networks Based on ReRAM Synaptic Array., , , , , , , , , and 2 other author(s). BioCAS, page 1-4. IEEE, (2018)Value-Aware Error Detection and Correction for SRAM Buffers in Low-Bitwidth, Floating-Point CNN Accelerators., , and . ASP-DAC, page 242-247. ACM, (2021)Block and Subword-Scaling Floating-Point (BSFP) : An Efficient Non-Uniform Quantization For Low Precision Inference., , and . ICLR, OpenReview.net, (2023)Bit-Serial Cache: Exploiting Input Bit Vector Repetition to Accelerate Bit-Serial Inference., and . DAC, page 1-6. IEEE, (2023)Morphable CIM: Improving Operation Intensity and Depthwise Capability for SRAM-CIM Architecture., and . DAC, page 1-6. IEEE, (2023)8-Bit Precision 6T SRAM Compute-in-Memory Macro Using Global Bitline-Combining Scheme for Edge AI Chips., , , , , , , , , and 11 other author(s). IEEE Trans. Circuits Syst. II Express Briefs, 71 (4): 2304-2308 (April 2024)A 65nm 1Mb nonvolatile computing-in-memory ReRAM macro with sub-16ns multiply-and-accumulate for binary DNN AI edge processors., , , , , , , , , and 7 other author(s). ISSCC, page 494-496. IEEE, (2018)DrowsyNet: Convolutional neural networks with runtime power-accuracy tunability using inference-stage dropout., , , , and . VLSI-DAT, page 1-4. IEEE, (2018)Considerations Of Integrating Computing-In-Memory And Processing-In-Sensor Into Convolutional Neural Network Accelerators For Low-Power Edge Devices., , , , , , , , , and 3 other author(s). VLSI Circuits, page 166-. IEEE, (2019)VST: A virtual stress testing framework for discovering bugs in SSD flash-translation layers., , and . ICCAD, page 283-290. IEEE, (2017)