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Low-Cost Hardening of Image Processing Applications Against Soft Errors.

, , , , and . DFT, page 274-279. IEEE Computer Society, (2006)

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The Complexity of Fault Detection Problems for Combinational Logic Circuits., and . IEEE Trans. Computers, 31 (6): 555-560 (1982)System-on-chip test scheduling with reconfigurable core wrappers., and . IEEE Trans. Very Large Scale Integr. Syst., 14 (3): 305-309 (2006)Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester., , , and . IEEE Trans. Very Large Scale Integr. Syst., 15 (7): 790-800 (2007)A Test Generation Method Based on k-Cycle Testing for Finite State Machines., , and . IOLTS, page 232-235. IEEE, (2019)A Latency Optimal Superstabilizing Mutual Exclusion Protocol in Unidirectional Rings., , , and . J. Parallel Distributed Comput., 62 (5): 865-884 (2002)A cost optimal parallel algorithm for weighted distance transforms., , , and . Parallel Comput., 25 (4): 405-416 (1999)Effect of BIST Pretest on IC Defect Level., , and . IEICE Trans. Inf. Syst., 89-D (10): 2626-2636 (2006)A Memory Grouping Method for Reducing Memory BIST Logic of System-on-Chips., , and . IEICE Trans. Inf. Syst., 89-D (4): 1490-1497 (2006)Effective Domain Partitioning for Multi-Clock Domain IP Core Wrapper Design under Power Constraints., , , and . IEICE Trans. Inf. Syst., 91-D (3): 807-814 (2008)Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability., , , and . IEICE Trans. Inf. Syst., 90-D (1): 296-305 (2007)