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Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

, , , , , , , , , и . ATS, стр. 139-146. IEEE, (2006)

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Kun-Han Lin

Ming-Han Tsai

Wei-Ding Tsai

Wei-Ding Tsai

Schi-chien Tsai

 

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