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Fault Coverage Enhancement via Weighted Random Pattern Generation in BIST Using a DNN-Driven-PSO Approach.

, , , , , и . ICIT, стр. 228-233. IEEE, (2019)

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Anupam Chattopadhyay

Santanu Sarma

Santanu Mukherjee

Dhrupadi Chattopadhyay

Santanu Pal

 

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