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Charge Sharing Fault Analysis and Testing for CMOS Domino Logic Circuits.

C. Cheng, J. Wang, S. Chang, and W. Jone. LATW, page 59-64. IEEE, (2000)

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Hugh Jones

Josef Edgar Jonek

Martina Jonen

Lars Jonetz-Mentzel

Stefan Joneleit

Other publications of authors with the same name

Design theory and implementation for low-power segmented bus systems.W. Jone, J. Wang, H. Lu, I. Hsu, and J. Chen. ACM Trans. Design Autom. Electr. Syst., 8 (1): 38-54 (2003)DyXY: a proximity congestion-aware deadlock-free dynamic routing method for network on chip.M. Li, Q. Zeng, and W. Jone. DAC, page 849-852. ACM, (2006)Fault simulation and response compaction in full scan circuits using HOPE.S. Das, C. Ramamoorthy, M. Assaf, E. Petriu, W. Jone, and M. Sahinoglu. IEEE Trans. Instrumentation and Measurement, 54 (6): 2310-2328 (2005)High-Performance Deadlock-Free ID Assignment for Advanced Interconnect Protocols.H. Chou, Y. Chen, K. Yang, J. Tsao, S. Chang, W. Jone, and T. Chen. IEEE Trans. Very Large Scale Integr. Syst., 24 (3): 1169-1173 (2016)Turbo1500: Core-Based Design for Test and Diagnosis.L. Wang, R. Apte, S. Wu, B. Sheu, W. Jone, J. Guo, K. Lee, W. Wang, X. Wen, H. Chao and 5 other author(s). IEEE Des. Test Comput., 26 (1): 26-35 (2009)On random testing for combinational circuits with a high measure of confidence.S. Das, and W. Jone. IEEE Trans. Syst. Man Cybern., 22 (4): 748-754 (1992)Delay Fault Coverage Enhancement Using Variable Observation Times.W. Jone, Y. Ho, and S. Das. J. Electron. Test., 11 (2): 131-146 (1997)Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis.W. Jone, D. Huang, S. Chang, and S. Das. VLSI Design, 12 (4): 457-474 (2001)A coordinated circuit partitioning and test generation method for pseudo-exhaustive testing of VLSI circuits.W. Jone, and C. Papachristou. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (3): 374-384 (1995)Pseudorandom test-length analysis using differential solutions.D. Li, and W. Jone. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (7): 815-825 (1996)

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Disambiguation of "Jone, Wen-Ben"

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Charge Sharing Fault Analysis and Testing for CMOS Domino Logic Circuits.

Please choose a person to relate this publication to

Hugh Jones

Josef Edgar Jonek

Martina Jonen

Lars Jonetz-Mentzel

Stefan Joneleit

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Jone, Wen-Ben"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Charge Sharing Fault Analysis and Testing for CMOS Domino Logic Circuits.

Please choose a person to relate this publication to

Hugh Jones

Josef Edgar Jonek

Martina Jonen

Lars Jonetz-Mentzel

Stefan Joneleit

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Charge Sharing Fault Analysis and Testing for CMOS Domino Logic Circuits.