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Другие публикации лиц с тем же именем

Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications., , , и . IOLTS, стр. 291-294. IEEE, (2018)Intra-Cell Defects Diagnosis., , , , , , и . J. Electron. Test., 30 (5): 541-555 (2014)Advanced test methods for SRAMs., , , , и . VTS, стр. 300-301. IEEE Computer Society, (2012)Alternatives to Fault Injections for Early Safety/Security Evaluations., , , , , и . ETS, стр. 1-10. IEEE, (2019)Defect analysis in power mode control logic of low-power SRAMs., , , , , , и . ETS, стр. 1. IEEE Computer Society, (2012)Through-Silicon-Via resistive-open defect analysis., , , , , и . ETS, стр. 1. IEEE Computer Society, (2012)Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs., , , , , и . VLSI-SoC (Selected Papers), том 508 из IFIP Advances in Information and Communication Technology, стр. 130-151. Springer, (2016)Failure Analysis and Test Solutions for Low-Power SRAMs., , , , , , , и . Asian Test Symposium, стр. 459-460. IEEE Computer Society, (2011)LIFTING: A Flexible Open-Source Fault Simulator., и . ATS, стр. 35-40. IEEE Computer Society, (2008)Comprehensive bridging fault diagnosis based on the SLAT paradigm., , , , , , , и . DDECS, стр. 264-269. IEEE Computer Society, (2009)