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Diagnosing realistic bridging faults with single stuck-at information.

, , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (3): 255-268 (1998)

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Mathematical Writing., , and . MAA notes Mathematical Association of America, (1989)Test Pattern Generation for Realistic Bridge Faults in CMOS ICs., and . ITC, page 492-499. IEEE Computer Society, (1991)Generating Test Patterns for Bridge Faults in CMOS ICs., and . EDAC-ETC-EUROASIC, page 165-170. IEEE Computer Society, (1994)Successful Interventions to Eliminate Achievement Gaps in STEM Courses., , , and . RESPECT, page 1-4. IEEE, (2020)Yield Optimization and Its Relation to Test., and . VTS, page 281-282. IEEE Computer Society, (2001)Diagnosing realistic bridging faults with single stuck-at information., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (3): 255-268 (1998)Efficient generation of test patterns using Boolean satisfiability.. Stanford University, USA, (1990)Diagnosis of realistic bridging faults with single stuck-at information., , , and . ICCAD, page 185-192. IEEE Computer Society / ACM, (1995)Efficient Generation of Test Patterns Using Boolean Difference.. ITC, page 795-802. IEEE Computer Society, (1989)On applying non-classical defect models to automated diagnosis., , , , , , and . ITC, page 748-757. IEEE Computer Society, (1998)