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Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric., , , , and . ACM Great Lakes Symposium on VLSI, page 127-130. ACM, (2010)Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG., , , and . IDT, page 122-127. IEEE, (2010)Information Delay Protocol Using Quantum Teleportation., and . ICNC (6), page 523-527. IEEE Computer Society, (2009)Research on Production-Oriented Virtual Enterprise Quality Information Management., , and . ICSS, page 370-373. IEEE Computer Society, (2010)A Personalized Learning Strategy Recommendation Approach for Programming Learning., , , , and . DASFAA Workshops, volume 10179 of Lecture Notes in Computer Science, page 267-274. Springer, (2017)Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test., , , and . Asian Test Symposium, page 301-306. IEEE Computer Society, (2010)Power Distribution Failure Analysis Using Transition-Delay Fault Patterns., , and . ITC, page 1. IEEE Computer Society, (2008)Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths., , and . VTS, page 221-226. IEEE Computer Society, (2009)Silicon evaluation of faster than at-speed transition delay tests., , , , , , , and . VTS, page 80-85. IEEE Computer Society, (2012)A Kalman smoother based estimation approach for dynamic adjustment systems with irregularly missing output data., , , and . ICPS, page 749-754. IEEE, (2021)