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Disambiguation of "Sánchez, Ernesto"

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On the Design of a Fault Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors.

, , , , , and . ISVLSI, page 491-496. IEEE Computer Society, (2015)

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David Sánchez Sánchez

Antonia Sánchez

Yerson Sánchez

Nydia Sánchez

David Sánchez

 

Other publications of authors with the same name

Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL., , , , , and . ITC, page 1-8. IEEE, (2019)Software-Based Self-Test Techniques for Dual-Issue Embedded Processors., , , , , and . IEEE Trans. Emerg. Top. Comput., 8 (2): 464-477 (2020)Code Generation for Functional Validation of Pipelined Microprocessors., , , and . J. Electron. Test., 20 (3): 269-278 (2004)Functional Verification of DMA Controllers., , , , , , and . J. Electron. Test., 27 (4): 505-516 (2011)Increasing reliability of safety critical applications through functional based solutions.. DTIS, page 1. IEEE, (2018)New evolutionary techniques for test-program generation for complex microprocessor cores., , , , , and . GECCO, page 2193-2194. ACM, (2005)Interactive presentation: An enhanced technique for the automatic generation of effective diagnosis-oriented test programs for processor., , , and . DATE, page 1158-1163. EDA Consortium, San Jose, CA, USA, (2007)On the functional test of Branch Prediction Units based on Branch History Table., , and . VLSI-SoC, page 278-283. IEEE, (2011)An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction., , , and . EvoWorkshops, volume 4974 of Lecture Notes in Computer Science, page 214-223. Springer, (2008)Exploiting HW Acceleration for Classifying Complex Test Program Generation Problems., , and . EvoWorkshops, volume 3005 of Lecture Notes in Computer Science, page 230-239. Springer, (2004)