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Embedded test control schemes for compression in SOCs., , and . DAC, page 679-684. ACM, (2002)An Experimental Study Comparing 74LS181 Test Sets., , and . COMPCON, page 384-387. IEEE Computer Society, (1985)Gate-to-channel shorts in BiCMOS logic gates., and . VTS, page 440-445. IEEE Computer Society, (1994)Crosstalk induced fault analysis in DRAMs., and . SoCC, page 171-172. IEEE, (2004)On the Reliability of the IBM MVS/XA Operating., and . IEEE Trans. Software Eng., 13 (10): 1135-1139 (1987)Design-for-testability for embedded delay-locked loops., and . IEEE Trans. Very Large Scale Integr. Syst., 13 (8): 984-988 (2005)Compression Technique for Interactive BIST Application., and . VTS, page 9-14. IEEE Computer Society, (2001)Optimal Logic Blocks for FPGAs, using Factorial Design Techniques., and . ICCD, page 470-474. IEEE Computer Society, (1994)Multiple Fault Detection in Parity Trees., , and . COMPCON, page 441-444. IEEE Computer Society, (1986)On Benchmarking Digital Testing Systems., and . ITC, page 997. IEEE Computer Society, (1988)