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Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.

T. Ni, J. Bian, Z. Yang, M. Nie, L. Yao, Z. Huang, A. Yan, и X. Wen. IEEE Des. Test, 39 (5): 34-42 (2022)

Please choose a person to relate this publication to

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Aibin Liang

Yan Yan

Shanshan Yan

Americanization in China: an analysis of General Motors and its strategies in ChinaS. Yan. Uni Mainz, (2009)

Yan Xu

Untersuchungen zur Verleimung von Holz und Holzspanplatten mit UF-Leimharzen und PMDIY. Xu. TU Braunschweig, (2009)

Yan Xu

Другие публикации лиц с тем же именем

Architecture of Cobweb-Based Redundant TSV for Clustered Faults.T. Ni, D. Liu, Q. Xu, Z. Huang, H. Liang, и A. Yan. IEEE Trans. Very Large Scale Integr. Syst., 28 (7): 1736-1739 (2020)Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS.A. Yan, C. Lai, Y. Zhang, J. Cui, Z. Huang, J. Song, J. Guo, и X. Wen. IEEE Trans. Emerg. Top. Comput., 9 (1): 520-533 (2021)Design of a Novel Self-Recoverable SRAM Cell Protected Against Soft Errors.A. Yan, J. Zhou, Y. Hu, Y. Chen, Z. Wu, и T. Ni. DSA, стр. 497-498. IEEE, (2019)Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications.A. Yan, Y. Chang, J. Xiang, H. Luo, J. Cui, Z. Huang, T. Ni, и X. Wen. ACM Great Lakes Symposium on VLSI, стр. 293-298. ACM, (2023)Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory.T. Song, H. Liang, Y. Sun, Z. Huang, M. Yi, X. Fang, и A. Yan. VTS, стр. 1-6. IEEE, (2019)Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS.A. Yan, Y. Ling, K. Yang, Z. Chen, и M. Yi. ATS, стр. 86-91. IEEE, (2018)IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications.A. Yan, C. Dong, X. Guo, J. Song, J. Cui, T. Ni, P. Girard, и X. Wen. ACM Great Lakes Symposium on VLSI, стр. 19-24. ACM, (2024)MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method.A. Yan, Z. Li, Z. Gao, J. Zhang, Z. Huang, T. Ni, J. Cui, X. Wang, P. Girard, и X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (7): 2205-2214 (июля 2024)Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique.A. Yan, Z. Chen, Z. Huang, X. Fang, M. Yi, и J. Guo. ITC-Asia, стр. 49-54. IEEE, (2018)Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications.A. Yan, Z. Fan, L. Ding, J. Cui, Z. Huang, Q. Wang, H. Zheng, P. Girard, и X. Wen. IEEE Trans. Aerosp. Electron. Syst., 58 (1): 517-529 (2022)

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Please choose a person to relate this publication to

Aibin Liang

Yan Yan

Shanshan Yan

Yan Xu

Yan Xu

Другие публикации лиц с тем же именем

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