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Disambiguation of "Waltl, Michael"

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A Recombination-Enhanced-Defect-Reaction-Based Model for the Gate Switching Instability in SiC MOSFETs.

, , , , , , , , , , , and . IRPS, page 3. IEEE, (2024)

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Gerhard Waltl

Peter Waltl

Hubert Waltl

Josef Waltl

Josef Waltl

 

Other publications of authors with the same name

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors., , , , , , , , , and 2 other author(s). IRPS, page 10. IEEE, (2022)A Recombination-Enhanced-Defect-Reaction-Based Model for the Gate Switching Instability in SiC MOSFETs., , , , , , , , , and 2 other author(s). IRPS, page 3. IEEE, (2024)Defect Spectroscopy in SiC Devices.. IRPS, page 1-9. IEEE, (2020)Neural Network with Optical Frequency-Coded ReLU., , , , , and . OFC, page 1-3. IEEE, (2024)Hot-carrier degradation in single-layer double-gated graphene field-effect transistors., , , , , , , and . IRPS, page 2. IEEE, (2015)CV Stretch-Out Correction after Bias Temperature Stress: Work-Function Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast States., , , , , and . IRPS, page 1-6. IEEE, (2021)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)WDM-Conscious Synaptic Receptor Assisted by SOA+EAM., , , and . OFC, page 1-3. IEEE, (2022)Low Cost and High Performance Radiation Hardened Latch Design for Reliable Circuits., and . ICECS, page 197-200. IEEE, (2019)Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistors., , , , , , and . ESSDERC, page 172-175. IEEE, (2015)