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Comparative Evaluation of Bluetooth and Wi-Fi Direct for Tablet-Oriented Educational Applications.

, , , , и . ACIIDS (1), том 10191 из Lecture Notes in Computer Science, стр. 345-354. (2017)

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Yoshinobu Kumazawa

 

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Post-BIST Fault Diagnosis for Multiple Faults., , , , , , и . IEICE Trans. Inf. Syst., 91-D (3): 771-775 (2008)Dynamic routing and wavelength assignment in multifiber WDM networks with sparse wavelength conversion., , , и . ICTC, стр. 567-572. IEEE, (2012)A Method to Find Don't Care Values in Test Sequences for Sequential Circuits., , , , и . ICCD, стр. 397-. IEEE Computer Society, (2003)Fault Simulation Techniques to Reduce IDDQ Measurement Vectors for Sequential Circuits., , , и . Asian Test Symposium, стр. 141-146. IEEE Computer Society, (1999)Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits., , и . Asian Test Symposium, стр. 312-317. IEEE Computer Society, (1998)Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation., , , и . VLSI Design, стр. 781-786. IEEE Computer Society, (2007)Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults., , , , и . ATS, стр. 97-102. IEEE Computer Society, (2008)New Class of Tests for Open Faults with Considering Adjacent Lines., , , , , , и . Asian Test Symposium, стр. 301-306. IEEE Computer Society, (2009)Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation., , , , и . GCCE, стр. 561-565. IEEE, (2022)Enhancement of Clock Delay Faults Testing., , , и . ETS, стр. 216. IEEE Computer Society, (2011)