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Fault Detection of Combinational Circuits Based on Supply Current.

, , , and . ITC, page 374-380. IEEE Computer Society, (1988)

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High speed IDDQ test and its testability for process variation., , , , and . Asian Test Symposium, page 344-349. IEEE Computer Society, (2000)Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field., , , , and . DFT, page 287-. IEEE Computer Society, (2001)Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits., , and . IEICE Trans. Inf. Syst., 87-D (3): 571-579 (2004)Test Time Reduction for I DDQ Testing by Arranging Test Vectors., , and . Asian Test Symposium, page 423-428. IEEE Computer Society, (2002)Identification of Feedback Bridging Faults with Oscillation., , and . Asian Test Symposium, page 25-. IEEE Computer Society, (1999)Fault Detection of Combinational Circuits Based on Supply Current., , , and . ITC, page 374-380. IEEE Computer Society, (1988)Practical Fault Coverage of Supply Current Tests for Bipolar ICs., , , and . DELTA, page 189-194. IEEE Computer Society, (2004)Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits., , and . Asian Test Symposium, page 171-176. IEEE Computer Society, (1996)Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates., , and . Asian Test Symposium, page 372-377. IEEE Computer Society, (1997)CMOS open defect detection by supply current test., , , and . DATE, page 509. IEEE Computer Society, (2001)