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Verification and debugging of IDDQ test of low power chips.

M. Laisne, T. Nguyen, S. Zuo, X. Pan, H. Cui, C. Bai, A. Street, M. Parley, N. Agrawal, and K. Sundararaman. ITC, page 1-7. IEEE Computer Society, (2007)

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Hailong Du

Hailong Ji

Hailong Gao

Keqiang Cui

Huiling Cui

Other publications of authors with the same name

Recycling common materials: Effectiveness, optimal decisions, and coordination mechanisms.H. Cui, and G. Sosic. Eur. J. Oper. Res., 274 (3): 1055-1068 (2019)Modeling Fault Coverage of Random Test Patterns.H. Cui, S. Seth, and S. Mehta. J. Electron. Test., 19 (3): 271-284 (2003)Incentives and Emission Responsibility Allocation in Supply Chains.S. Gopalakrishnan, D. Granot, F. Granot, G. Sosic, and H. Cui. Manag. Sci., 67 (7): 4172-4190 (2021)A dense clutter sparse algorithm for the random finite set filters.W. Liu, C. Wen, and H. Cui. ICCAIS, page 68-73. IEEE, (2015)Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture.E. Flanigan, R. Adapa, H. Cui, M. Laisne, S. Tragoudas, and T. Petrov. VLSI Design, page 805-812. IEEE Computer Society, (2007)Event-Triggered Control for High-Order Uncertain Nonlinear Multiagent Systems Subject to Denial-of-Service Attacks.Z. Li, C. Hua, K. Li, and H. Cui. IEEE Trans. Syst. Man Cybern. Syst., 52 (10): 6129-6138 (2022)A Novel Method to Improve the Test Efficiency of VLSI Tests.H. Cui, S. Seth, and S. Mehta. ASP-DAC/VLSI Design, page 499-504. IEEE Computer Society, (2002)Predicting product return volume using machine learning methods.H. Cui, S. Rajagopalan, and A. Ward. Eur. J. Oper. Res., 281 (3): 612-627 (2020)Impact of Task-Level Worker Specialization, Workload, and Product Personalization on Consumer Returns.H. Cui, S. Rajagopalan, and A. Ward. Manuf. Serv. Oper. Manag., 23 (2): 346-366 (2021)A Novel Adaptive Event-Triggered Consensus Control Approach to Multi-Agent Systems With Guaranteed Positive MIET.H. Cui, G. Zhao, S. Liu, and Z. Li. IEEE Trans. Netw. Sci. Eng., 11 (1): 270-283 (January 2024)

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Disambiguation of "Cui, Hailong"

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Verification and debugging of IDDQ test of low power chips.

Please choose a person to relate this publication to

Hailong Du

Hailong Ji

Hailong Gao

Keqiang Cui

Huiling Cui

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Cui, Hailong"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Verification and debugging of IDDQ test of low power chips.

Please choose a person to relate this publication to

Hailong Du

Hailong Ji

Hailong Gao

Keqiang Cui

Huiling Cui

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Verification and debugging of IDDQ test of low power chips.