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Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

L. Xu, J. Cao, B. Bhuva, I. Chatterjee, S. Wen, R. Wong, and L. Massengill. IRPS, page 1-5. IEEE, (2019)

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Walter Wong

Limsoon Wong

Hoi-Ming Wong

Yasert Wongthonglua

Wei-chwen Wong

Other publications of authors with the same name

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.Y. Ren, A. He, S. Shi, G. Guo, L. Chen, S. Wen, R. Wong, N. van Vonno, and B. Bhuva. J. Electron. Test., 30 (1): 149-154 (2014)Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.Y. Ren, S. Shi, L. Chen, H. Wang, L. Gao, G. Guo, S. Wen, R. Wong, and N. van Vonno. J. Electron. Test., 29 (4): 609-616 (2013)A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.S. Kundu, M. Liu, R. Wong, S. Wen, and C. Kim. ISSCC, page 308-310. IEEE, (2018)A parallel sort-balance mutual range-join algorithm on hypercube computers.R. Wong, R. Topor, and H. Shen. Microprocess. Microsystems, 22 (3-4): 209-215 (1998)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.J. Cao, L. Xu, B. Bhuva, S. Wen, R. Wong, B. Narasimham, and L. Massengill. IRPS, page 1-5. IEEE, (2019)Networking industry trends in ESD protection for high speed IOs.R. Wong, R. Fung, and S. Wen. ASICON, page 1-4. IEEE, (2013)Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.L. Xu, J. Cao, B. Bhuva, I. Chatterjee, S. Wen, R. Wong, and L. Massengill. IRPS, page 1-5. IEEE, (2019)Dynamic access control method for SDP-based network environments.H. You, D. Ko, D. Kim, R. Wong, and I. Joe. EURASIP J. Wirel. Commun. Netw., 2023 (1): 94 (December 2023)Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations.C. Jung, S. Baeg, S. Wen, and R. Wong. ISQED, page 390-397. IEEE, (2011)Study of proton radiation effect to row hammer fault in DDR4 SDRAMs.C. Lim, K. Park, G. Bak, D. Yun, M. Park, S. Baeg, S. Wen, and R. Wong. Microelectron. Reliab., (2018)

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Disambiguation of "Wong, Richard"

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Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

Please choose a person to relate this publication to

Walter Wong

Limsoon Wong

Hoi-Ming Wong

Yasert Wongthonglua

Wei-chwen Wong

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wong, Richard"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

Please choose a person to relate this publication to

Walter Wong

Limsoon Wong

Hoi-Ming Wong

Yasert Wongthonglua

Wei-chwen Wong

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.