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Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.

, , , , , and . DDECS, page 21-26. IEEE, (2023)

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A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)On the Automation of the Test Flow of Complex SoCs., , , , , and . VTS, page 166-171. IEEE Computer Society, (2006)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , and . VTS, page 1-7. IEEE, (2023)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults., , , , , and . DDECS, page 21-26. IEEE, (2023)An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip., , , , , , and . ETS, page 1-6. IEEE, (2022)Embedded Memory Diagnosis: An Industrial Workflow., , , , , and . ITC, page 1-9. IEEE Computer Society, (2006)Yield Analysis of Logic Circuits., , , , , and . VTS, page 103-108. IEEE Computer Society, (2004)