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Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.

P. Bernardi, G. Filipponi, M. Reorda, D. Appello, C. Bertani, and V. Tancorre. DDECS, page 21-26. IEEE, (2023)

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Vincenzo Casulli

Vincenzo Ferrazzano

Vincenzo Mancuso

Vincenzo Mercurio

Vincenzo Gulisano

Other publications of authors with the same name

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips.F. Angione, D. Appello, P. Bernardi, A. Calabrese, S. Quer, M. Reorda, V. Tancorre, and R. Ugioli. IEEE Access, (2023)On the Automation of the Test Flow of Complex SoCs.D. Appello, V. Tancorre, P. Bernardi, M. Grosso, M. Rebaudengo, and M. Reorda. VTS, page 166-171. IEEE Computer Society, (2006)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level.F. Angione, P. Bernardi, G. Filipponi, C. Tempesta, M. Reorda, D. Appello, V. Tancorre, and R. Ugioli. DFT, page 1-6. IEEE, (2022)A guided debugger-based fault injection methodology for assessing functional test programs.F. Angione, P. Bernardi, N. Giardino, D. Appello, C. Bertani, and V. Tancorre. VTS, page 1-7. IEEE, (2023)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures.D. Appello, P. Bernardi, A. Calabrese, S. Littardi, G. Pollaccia, S. Quer, V. Tancorre, and R. Ugioli. DDECS, page 69-74. IEEE, (2021)A novel SEU injection setup for Automotive SoC.G. Iaria, T. Foscale, P. Bernardi, L. Presicce, M. Reorda, D. Appello, V. Tancorre, and R. Ugioli. ISIE, page 623-626. IEEE, (2022)Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.P. Bernardi, G. Filipponi, M. Reorda, D. Appello, C. Bertani, and V. Tancorre. DDECS, page 21-26. IEEE, (2023)An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.F. Angione, P. Bernardi, G. Filipponi, M. Reorda, D. Appello, V. Tancorre, and R. Ugioli. ETS, page 1-6. IEEE, (2022)Embedded Memory Diagnosis: An Industrial Workflow.D. Appello, V. Tancorre, P. Bernardi, M. Grosso, M. Rebaudengo, and M. Reorda. ITC, page 1-9. IEEE Computer Society, (2006)Yield Analysis of Logic Circuits.D. Appello, A. Fudoli, K. Giarda, E. Gizdarski, B. Mathew, and V. Tancorre. VTS, page 103-108. IEEE Computer Society, (2004)

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Disambiguation of "Tancorre, Vincenzo"

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Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.

Please choose a person to relate this publication to

Vincenzo Casulli

Vincenzo Ferrazzano

Vincenzo Mancuso

Vincenzo Mercurio

Vincenzo Gulisano

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Tancorre, Vincenzo"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.

Please choose a person to relate this publication to

Vincenzo Casulli

Vincenzo Ferrazzano

Vincenzo Mancuso

Vincenzo Mercurio

Vincenzo Gulisano

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults.