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Disambiguation of "Wu, Zhicheng"

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Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling.

, , , , , , , , , and . IRPS, page 1-7. IEEE, (2019)

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Zhicheng Duan

Zhicheng Zheng

Zhicheng Liu

Jinglan Wu

Recovery of citric acid from fermentation broth using simulated moving bed technology: = Reinigung von Zitronensäure aus Fermentationslösung durch kontinuierliche Chromatographie. Uni Erlangen-Nürnberg, (2009)

Jinjin Wu

 

Other publications of authors with the same name

Data Standard Construction., , and . EDGE, volume 14205 of Lecture Notes in Computer Science, page 46-54. Springer, (2023)Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper., , , , , , , , , and 3 other author(s). ICICDT, page 1-4. IEEE, (2021)Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET., , , , , , , , and . IRPS, page 1-5. IEEE, (2023)Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies., , , , , , , , , and 10 other author(s). IRPS, page 1-6. IEEE, (2021)Deep Global and Local Generative Model for Recommendation., , , , , , , and . WWW, page 551-561. ACM / IW3C2, (2020)Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling., , , , , , , , , and . IRPS, page 1-7. IEEE, (2019)Study on the impact of indirect driving system on mental workload and task performance of driver., , and . ICVES, page 53-56. IEEE, (2013)Research on UAV power inspection trajectory optimization algorithm.. ICBASE, page 319-322. IEEE, (2023)The properties, effect and extraction of localized defect profiles from degraded FET characteristics., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2021)A BSIM-Based Predictive Hot-Carrier Aging Compact Model., , , , , , , , , and . IRPS, page 1-9. IEEE, (2021)