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A BSIM-Based Predictive Hot-Carrier Aging Compact Model.

Y. Xiang, S. Tyaginov, M. Vandemaele, Z. Wu, J. Franco, E. Bury, B. Truijen, B. Parvais, D. Linten, and B. Kaczer. IRPS, page 1-9. IEEE, (2021)

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Dietrich Brecht

Rudolf Brecht

Wilhelm Brecht

Kornelia Brecht

Winfried Brecht

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Physics-based device aging modelling framework for accurate circuit reliability assessment.Z. Wu, J. Franco, B. Truijen, P. Roussel, S. Tyaginov, M. Vandemaele, E. Bury, G. Groeseneken, D. Linten, and B. Kaczer. IRPS, page 1-6. IEEE, (2021)Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks.B. Truijen, B. O'Sullivan, M. Alam, D. Claes, M. Thesberg, P. Roussel, A. Chasin, G. den Bosch, B. Kaczer, and J. Houdt. IRPS, page 12-1. IEEE, (2022)Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery.J. Bastos, B. O'Sullivan, J. Franco, S. Tyaginov, B. Truijen, A. Chasin, R. Degraeve, B. Kaczer, R. Ritzenthaler, E. Capogreco and 7 other author(s). IRPS, page 1-6. IEEE, (2022)Transition-state-theory-based interpretation of Landau double well potential for ferroelectrics.M. Alam, S. Clima, B. Kaczer, P. Roussel, B. Truijen, L. Ragnarsson, N. Horiguchi, M. Heyns, and J. Houdt. CoRR, (2024)A BSIM-Based Predictive Hot-Carrier Aging Compact Model.Y. Xiang, S. Tyaginov, M. Vandemaele, Z. Wu, J. Franco, E. Bury, B. Truijen, B. Parvais, D. Linten, and B. Kaczer. IRPS, page 1-9. IEEE, (2021)Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements.M. Alam, Y. Higashi, B. Truijen, B. Kaczer, M. Popovici, B. O'Sullivan, P. Roussel, R. Degraeve, M. Heyns, and J. Houdt. VLSI Technology and Circuits, page 340-342. IEEE, (2022)Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors.K. Croes, V. Simons, B. Truijen, P. Roussel, K. Sever, A. Tsiara, J. Franco, and P. Absil. OFC, page 1-3. IEEE, (2022)Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics.B. O'Sullivan, B. Truijen, V. Putcha, A. Grill, A. Chasin, G. den Bosch, B. Kaczer, M. Alam, and J. Houdt. IRPS, page 4. IEEE, (2022)Fundamental understanding of NBTI degradation mechanism in IGZO channel devices.Y. Zhao, P. Rinaudo, A. Chasin, B. Truijen, B. Kaczer, N. Rassoul, H. Dekkers, A. Belmonte, I. Wolf, G. Kar and 1 other author(s). IRPS, page 1-7. IEEE, (2024)

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Disambiguation of "Truijen, Brecht"

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A BSIM-Based Predictive Hot-Carrier Aging Compact Model.

Please choose a person to relate this publication to

Dietrich Brecht

Rudolf Brecht

Wilhelm Brecht

Kornelia Brecht

Winfried Brecht

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Truijen, Brecht"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A BSIM-Based Predictive Hot-Carrier Aging Compact Model.

Please choose a person to relate this publication to

Dietrich Brecht

Rudolf Brecht

Wilhelm Brecht

Kornelia Brecht

Winfried Brecht

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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A BSIM-Based Predictive Hot-Carrier Aging Compact Model.