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Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , and . DDECS, page 1-6. IEEE, (2019)A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)An innovative Strategy to Quickly Grade Functional Test Programs., , , , , , , , , and . ITC, page 355-364. IEEE, (2022)Innovative methods for Burn-In related Stress Metrics Computation., , , , , , , , and . DTIS, page 1-6. IEEE, (2021)An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip., , , , , , and . ETS, page 1-6. IEEE, (2022)Test, Reliability and Functional Safety Trends for Automotive System-on-Chip., , , , , , , , , and 14 other author(s). ETS, page 1-10. IEEE, (2022)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)